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Hyonchol Kim, Tsutomu Negishi, Masato Kudo, Hiroyuki Takei, and Kenji Yasuda Kanagawa Academy of Science and Technology, KSP East 310, 3-2-1 Sakado, Takatsu-ku, Kawasaki, Kanagawa 213-0012, Japan JEOL Ltd., 1-2 Musashino 3-Chome, Akishima, Tokyo 196-8558, Japan Department of Life Sciences, Faculty of Life Sciences, Toyo University, 1-1-1 Izumino, Itakura-machi, Oura-gun, Gunma 374-0193, Japan Department of Biomedical Information, Division of Biosystems, Institute of Biomaterials and Bioengineering, Tokyo Medical and Dental University, 2-3-10 Kanda-Surugadai, Chiyoda-ku, Tokyo 101-0062, Japan *yasuda.bmi@tmd.ac.jp

Backscattered Electron Contrast Imaging of Scanning Electron Microscopy for Identifying Double Layered Nano-Scale Elements