English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Tools annual

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Presents the access of premium content as premium feature

Premium Content

Global: Zendy Plus annual

Global: Zendy Free Plan

X-ray magnetic circular dichroism (XMCD) is a powerful method to study the magnetic properties of magnetic thin films. However it provides depth-averaged information. Recently, we have developed a simple but effective depth-resolved technique in XMCD by using an imaging type microchannel plate detector. The performance of this method is demonstrated by applying to the depth-resolved analyses of Ni/Cu(100) and the effect of CO adsorption on Ni/Cu(100), Fe/Cu(100) and Fe/Ni/Cu(100) magnetic thin films. For Ni/Cu(100), magnetic orbital moments of the surface and internal layers are extracted to give deep insight for the spin reorientation transitions. For 7 ML Fe/Cu(100), the surface two layers are ferromagnetically coupled, while the inner layers are non-magnetic at 200 K and are in the spin density wave (SDW) state at 130 K. For Fe/Ni/Cu(100), magnetically live surface layers and some thickness-dependent magnetic coupling between the Fe surface and Ni film have been observed.

Development of a Depth-resolved XMCD Method and Its Application to the Study of Surface and Interface Magnetic Properties of Metal Thin Films