Present State of the Surface Potential Measurements by Kelvin Force Microscopy. Potential Measurements by KFM on InAs Thin Film Surfaces Grown on (110) GaAs Substrates. | Zendy

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Present State of the Surface Potential Measurements by Kelvin Force Microscopy. Potential Measurements by KFM on InAs Thin Film Surfaces Grown on (110) GaAs Substrates.

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