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Background  Programmed cell death plays an important role in mediating plant adaptive responses to the environment such as the invasion of pathogens. Verticillium wilt, caused by the necrotrophic pathogen  Verticillium dahliae , is a serious vascular disease responsible for great economic losses to cotton, but the molecular mechanisms of verticillium disease and effective, safe methods of resistance to verticillium wilt remain unexplored.    Methodology/Principal Findings  In this study, we introduced baculovirus apoptosis inhibitor genes  p35  and  op-iap  into the genome of cotton via  Agrobacterium -mediated transformation and analyzed the response of transgenic plants to verticillium wilt. Results showed that  p35  and  op-iap  constructs were stably integrated into the cotton genome, expressed in the transgenic lines, and inherited through the T 3  generation. The transgenic lines had significantly increased tolerance to verticillium wilt throughout the developmental stages. The disease index of T 1 –T 3  generation was lower than 19, significantly (P<0.05) better than the negative control line z99668. After treatment with 250 mg/L VD-toxins for 36 hours, DNA from negative control leaves was fragmented, whereas fragmentation in the transgenic leaf DNA did not occur. The percentage of cell death in transgenic lines increased by 7.11% after 60 mg/L VD-toxin treatment, which was less than that of the negative control lines's 21.27%. This indicates that  p35  and  op-iap  gene expression partially protects cells from VD-toxin induced programmed cell death (PCD).    Conclusion/Significance    Verticillium dahliae  can trigger plant cells to die through induction of a PCD mechanism involved in pathogenesis. This paper provides a potential strategy for engineering broad-spectrum necrotrophic disease resistance in plants.

Expression of Baculovirus Anti-Apoptotic Genes p35 and op-iap in Cotton (Gossypium hirsutum L.) Enhances Tolerance to Verticillium Wilt