English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

In this work we demonstrate a simple setup to generate and measure arbitraryvector beams that are tightly focused. The vector beams are created with aspatial light modulator and focused with a microscope objective with aneffective numerical aperture of 1.2. The transverse polarization components($E_x$, $E_y$) of the tightly focused vector beams are measured with 3 stepinterferometry. The axial component $E_z$ is reconstructed using the transversefields with Gauss law. We measure beams with the following polarization states:circular, radial, azimuthal, spiral, flower and spider web.

Interferometric measurement of arbitrary propagating vector beams that are tightly focused