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The characterization of a third order nonlinear integrated waveguide isreported for the first time by means of a top-hat Dispersive-Scan (D-Scan)technique, a temporal analog of the top-hat Z-Scan. With a single laser beam,and by carrying two counter-directional nonlinear transmissions to assess theinput and output coupling efficiencies, a novel procedure is described leadingto an accurate measurement of the TPA figure of merit, the effective Two-PhotonAbsorption (TPA) and optical Kerr (including the sign) coefficients. Thetechnique is validated in a silicon strip waveguide for which the effectivenonlinear coefficients are measured with an accuracy of $\pm 10~\%$

Bi-directional top hat D-Scan: single beam accurate characterization of nonlinear waveguides