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The optical analogue of quantum weak measurements has shown considerable promise for the amplification and observation of tiny optical beam shifts, namely Goos-Hänchen (GH) and Imbert-Fedorov (IF) shifts. Here, we demonstrate simultaneous weak value amplification of both the angular GH and the IF shifts in partial reflection of a fundamental Gaussian beam at planar dielectric interfaces. We employ pre and postselection schemes with appropriate linear polarization basis states for simultaneous weak measurements and amplification of both of these shifts. The experimentally observed enhancement of the beam shifts and their dependence on the angle of incidence are analyzed/interpreted via theoretical treatment of weak measurements.

Simultaneous weak value amplification of angular Goos–Hänchen and Imbert–Fedorov shifts in partial reflection