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Dual-comb microscopy (DCM), an interesting imaging modality based on theoptical-frequency-comb (OFC) mode and image pixel one-to-one correspondence,benefits from scan-less full-field imaging and simultaneous confocal amplitudeand phase imaging. However, the two fully frequency-stabilized OFC sourcesrequirement hampers DCM practicality due to the complexity and costs. Here, abidirectional single-cavity dual-comb fiber laser (SCDCFL) is adopted as a DCMlow-complexity OFC source. Computational image correction reduces the imageblur caused by the SCDCFL residual timing jitter. Nanometer-order step surfaceprofilometry with a 14.0 nm uncertainty highlights the image-corrected DCMeffectiveness. The proposed method enhances the DCM versality and practicality.

Computationally image-corrected dual-comb microscopy with a free-running single-cavity dual-comb fiber laser