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Plasmonic waveguides are a promising platform for integrated nanophotoniccircuits and nanoscale quantum optics. Their use is however often hampered bythe limited propagation length of the guided surface plasmon modes. A detailedunderstanding of the influence of the material quality and the waveguidegeometry on the complex mode index is therefore crucial. In this letter, wepresent interferometric near-field measurements at telecommunication wavelengthon plasmonic slot waveguides fabricated by focused ion beam milling in single-and poly-crystalline gold films. We observe a significantly better performanceof the slot waveguides in the single-crystalline gold film for slot widthsbelow $100\,\mathrm{nm}$. In contrast for larger slot widths, both gold filmsgive rise to comparable mode propagation lengths. Our experimental observationsindicate that the nature of the dominant loss channel changes with increasinggap size from Ohmic to leakage radiation. Our experimental findings arereproduced by three dimensional numerical calculations.

Interferometric near-field characterization of plasmonic slot waveguides in single- and poly-crystalline gold films