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A CMOS-compatible plasmonic TE-pass polarizer capable of working in the O, E,S, C, L, and U bands is numerically analyzed. The device is based on anintegrated hybrid plasmonic waveguide (HPW) with a segmented metal design. Thesegmented metal will avoid the propagation of the TM mode, confined in the slotof the HPW, while the TE fundamental mode will pass. The TE mode is notaffected by the metal segmentation since it is confined in the core of the HPW.The concept of the segmented metal can be exploited in a plasmonic circuit withHPWs as the connecting waveguides between parts of the circuit and in a siliconphotonics circuit with strip or slab waveguides connecting the different partsof the circuit. Using 3D FDTD simulations, it is shown that for a length of 5.5{\mu}m the polarization extinction ratios are better than 20 dB and theinsertion losses are less than 1.7 dB over all the optical communication bands.

CMOS compatible multi-band plasmonic TE-pass polarizer