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Transverse photo-induced voltage (TPIV) in 25nm-thick Au film with randomholes with 100 nm in diameter is measured for linearly, circularly andelliptically polarized light. By rotating the major axis of ellipse of thelight, TPIV exhibits specific pattern depending on polarization. Theexperimental results are readily reproduced by assuming that the angularmomentum transfer from the light beam to the film is responsible for TPIV. Anovel ellipticity meter is proposed based on this mechanism.

Polarization dependence of transverse photo-induced voltage in gold thin film with random nanoholes