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The performance of the knife-edge method as a beam profiling technique fortightly focused light beams depends on several parameters, such as the materialand height of the knife-pad as well as the polarization and wavelength of thefocused light beam under study. Here we demonstrate that the choice of thesubstrate the knife-pads are fabricated on has a crucial influence on thereconstructed beam projections as well. We employ an analytical model for theinteraction of the knife-pad with the beam and report good agreement betweenour numerical and experimental results. Moreover, we simplify the analyticalmodel and demonstrate, in which way the underlying physical effects lead to theapparent polarization dependent beam shifts and changes of the beamwidth fordifferent substrate materials and heights of the knife-pad.

Influence of the substrate material on the knife-edge based profiling of tightly focused light beams