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This research presents a novel method to calibrate a microscopic structured light system using a camera with a telecentric lens. The pin-hole projector calibration follows the standard pin-hole camera calibration procedures. With the calibrated projector, the 3D coordinates of those feature points used for projector calibration are then estimated through iterative Levenberg-Marquardt optimization. Those 3D feature points are further used to calibrate the camera with a telecentric lens. We will describe the mathematical model of a telecentric lens, and demonstrate that the proposed calibration framework can achieve very high accuracy: approximately 10 μm with a volume of approximately 10(H) mm × 8(W) mm × 5(D) mm.

Flexible calibration method for microscopic structured light system using telecentric lens