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Enhanced backscattering (EBS), also known as weak localization of light, is derived using the Huygens-Fresnel principle and backscattering is generally shown to be the sum of an incoherent baseline and a phase conjugated portion of the incident wave that forms EBS. The phase conjugated portion is truncated by an effective aperture described by the probability function P(s) of coherent path-pair separations. P(s) is determined by the scattering properties of the medium and so characterization of EBS can be used for metrology of scattering materials. A three dimensional intensity peak is predicted in free space at a point conjugate to the source and is experimentally observed.

Alternate formulation of enhanced backscattering as phase conjugation and diffraction: derivation and experimental observation