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Many new types of sensing or imaging surfaces are based on periodic thinfilms. It is explained how the response of those surfaces to partially coherentfields can be fully characterized by a set of functions in the wavenumberspectrum domain. The theory is developed here for the case of 2D absorbers withTE illumination and arbitrary material properties in the plane of the problem,except for the resistivity which is assumed isotropic. Sum and differencecoordinates in both spatial and spectral domains are conveniently used torepresent the characteristic functions, which are specialized here to the caseof periodic structures. Those functions can be either computed or obtainedexperimentally. Simulations rely on solvers based on periodic-boundaryconditions, while experiments correspond to Energy Absorption Interferometry(EAI), already described in the literature. We derive rules for the convergenceof the representation versus the number of characteristic functions used, aswell as for the sampling to be considered in EAI experiments. Numericalexamples are given for the case of absorbing strips printed on a semi-infinitesubstrate.

Characteristic Functions Describing the Power Absorption Response of Periodic Structures to Partially Coherent Fields