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Single-photon detectors based on avalanche photodiodes (SPAD) are keyelements of many modern highly sensitive optical systems. One of thebottlenecks of such detectors is a afterpulsing effect which limits a detectionrate and requires an optimal hold-off time. In this letter we propose a novelapproach for statistical analysis of SPAD dark counts and we demonstrate itsusefulness for the search of the experimental condition where the afterpulsingeffect can be strongly eliminated. This approach exploits a sequence of rankedtime intervals between the dark counts and does not contain a complexmathematical analysis of the experimental data. We show that the approach canbe efficiently applied for a small number of the dark counts and it seems to bevery beneficial for practical characterization of SPAD devices.

Sequences of the ranged amplitudes as a universal method for fast noninvasive characterization of SPAD dark counts