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Two-dimensional materials such as MoS2 have attracted much attention inrecent years due to their fascinating optoelectronic properties. Dielectricproperty of MoS2 is desired for the optoelectronic application. In this paper,terahertz (THz) time-domain spectroscopy and ellipsometry technology areemployed to investigate the dielectric response of MoS2 crystal in THz andvisible region. The real and imaginary parts of the complex dielectric constantof MoS2 crystal are found to follow a Drude model in THz region, which is dueto the intrinsic carrier absorption. In visible region, the general trend ofthe complex dielectric constant is found to be described with a Lorentz model,while two remarkable peaks are observed at 1.85 and 2.03 eV, which have beenattributed to the splitting arising from the combined effect of interlayercoupling and spin-orbit coupling. This work affords the fundamental dielectricdata for the future optoelectronic applications with MoS2.

Dielectric Property of MoS2 Crystal in Terahertz and Visible Region