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We present an optical setup that can be used to characterize the thicknessesof thin NbN films to screen samples for fabrication and to better model theperformance of the resulting superconducting nanowire single photon detectors.The infrared transmissometer reported here is easy to use, gives results withinminutes and is non-destructive. Thus, the thickness measurement can be easilyintegrated into the workflow of deposition and characterization. Comparison toa similar visible-wavelength transmissometer is provided.

Infrared Transmissometer to Measure the Thickness of NbN Thin Films