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: Ion beam methods of surface characterization have not been applied extensively to polymers and other organic materials, but would appear to be very useful for these materials. Applications of high energy ion beam methods would seem to be limited except for specific cases but low energy methods such as ion scattering spectrometry (ISS) and secondary ion mass spectrometry (SIMS) should have numerous uses with polymeric materials. ISS is a true surface method which determines elemental composition at the first monolayer, but tells little about how the elements are combined. SIMS has high sensitivity for many elements, and has the capability of determining something of the molecular structure near the surface. Both ISS and SIMS, as well as high energy methods, give elemental composition with depth. These surface spectroscopies are useful in many areas of polymer technology including synthesis, extrusion and forming, and long time durability and stability under thermal and electromagnetic radiation. (Author)

Ion beam methods for the surface characterization of polymers