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Relationship between reflection resonance and applied current density in Bragg photonic crystal has been investigated.Multiple bit encodes of distributed Bragg reflector features have been prepared by electrochemical etching of crystallinesilicon by using various square wave current densities. Optical characterization of multi-encoding of distributed Braggreflectors on porous silicon was achieved by Ocean optics 2000 spectrometer for the search of possible applications ofmultiple bit encoding of distributed Bragg reflectors such as multiplexed assays and chemical sensors. The morphologyand cross-sectional structure of multi-encoded distributed Bragg reflectors was investigated by field emission scanningelectron micrograph.Key words : Encoding, Bragg, Photonics, Porous Silicon 1. Introduction Multistructured porous silicons (PSi) such as distrib-uted Bragg reflectors (DBR) PSi and Rugate PSi havebeen a topic of interest, because of their use in chemicaland biological sensors, biomaterials, and opticaldevices

Investigation of Relationship between Reflection Resonance and Applied Current Density in Bragg Photonic Crystal