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In this paper, we propose multimodal artifact metrics.We came up with this idea based on multimodalidentification metrics in biometrics and is expected toverify the artifact’s authenticity with high accuracy byusing more than two characteristic information withdifferent physical characteristics extracted from the artifact.In this technique, counterfeiting of copied products seemsto be more difficult even for the manufacturers who areproducing the genuine products. In order to explore thefeasibility of this idea, we present the results of twoexperiments: One is making samples made of conductivepolymer and filler with optical characteristic. Another oneis extracting two types of characteristic information fromeach sample. Extracted information (resistance and IRimage) were different for each specimen, as we estimated.

Mutimodal Artifact Metrics and its Applicability Experiments