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The aim of the present paper is to study the possibility of application of the X-ray quasi-forbidden reflection method to the composition determination of the sphalerite-type Cd 1x Μ xΤe (Μ = Mg, Zn, Mn) single crystals. The method is based on the property of quasi-forbidden reflections that their integral intensity is very sensitive to composition and weakly sensitive to crystal lattice defects. An example of application for a Cd1x Μn x Te single crystal is presented. PACS numbers: 61.10.Wg

Composition Determination of Some AIIBVITernary Semiconductors from Quasi-Forbidden Reflection Intensity

Composition Determination of Some A^IIB^VITernary Semiconductors from Quasi-Forbidden Reflection Intensity