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Dislocations parallel to a Schottky junction are considered as an example of well defined extended defects, and their behaviour in DLTS experiment is examined. A possibility of electron hopping between different traps of the defect, and inter-electronic Coulomb interaction are taken into account. Thermal electron emission from the considered defects is no longer exponential with time and consequences of this fact are discussed.

Electron Emission from Extended Defects in DLTS Experiment