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Influence of annealing on hysteresis properties of the soft magnetic layer in Fe20Ni80/Tb26Co74 and Fe20Ni80/Ti/Tb26Co74 films with unidirectional anisotropy was investigated. Modification of the interface by introduction of the ultrathin Ti spacer was demonstrated to improve stability of coercivity and exchange bias field. According to our assumption, the Ti spacer can act as a barrier preventing a thermally-induced diffusion between the magnetic layers. In order to verify this point grazing incidence X-ray fluorescent analysis was used. Comparison of two sets of data attributed to the samples with and without Ti spacer at different stages of annealing revealed decrease of the angular shift between Co and Ni dependences even after annealing at 70 degrees C for Fe20Ni80/Tb26Co74 and absent of any changes up to 300 degrees C for the Fe20Ni80/Ti/Tb26Co74 film. These results can be interpreted as an evidence of the low-temperature interface modification in form of diffusion-like process in the samples without Ti spacer.

Influence of the Interface Quality on Magnetic Properties of Fe20Ni80/Tb-Co Films with Unidirectional Anisotropy

Influence of the Interface Quality on Magnetic Properties of Fe₂₀Ni₈₀/Tb-Co Films with Unidirectional Anisotropy