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The fast domain wall dynamics of amorphous glass-coated microwires can be changed drastically by properly selected annealing temperature. Here, the effect of thermal annealing on the surface domain structure of microwires is examined. Imaging the surface domain structure by Bitter colloid revealed the periodic pattern in each studied sample. Thermal annealing of microwires results in the five times increase of the domain wall velocity, as compared to the as-cast state. Influence of the surface domain structure on the fast domain wall propagation in microwires is discussed.

Imaging the Surface Domain Structure of Amorphous Glass-Coated Microwires by Bitter Colloid