English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

The Transient Fluctuation Theorem is used to calibrate an Atomic ForceMicroscope by measuring the fluctuations of the work performed by a timedependent force applied between a collo{\"i}dal probe and the surface. Fromthis measure one can easily extract the value of the interaction force and therelevant parameters of the cantilever. The results of this analysis arecompared with those obtained by standard calibration methods. a) presentadress: ISIS, Univ.

Calibrated force measurement in Atomic Force Microscopy using the Transient Fluctuation Theorem