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Reliability of sequential circuits is emerging as an important concern in scaled electronic technologies. In this paper,a survey of the research progress of the high-level reliability analysis for sequential circuits was given. Specially, we focused on Bayesian reliability analysis, multiple-pass reliability analysis and reliability estimation of sequential cir­ cuit based on probabilistic transfer matrix. And these analysis methods of sequential circuit were selected for experiment on the ISCAS 89 benchmark circuits. Research results and experimental results show that the abstraction level of circuit is higher,the accuracy of the results is lower,and the time overhead will be less. In the same abstraction level,the simu­ lation methods have high accuracy,but also have more runtime,and analytical methods have low time overhead, but less accurate.

高层次时序电路可靠度估计方法研究进展 (Survey on Reliability Estimation Methods of Sequential Circuit in Height-level).