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To accurately simulate the continuous property change of functionally graded piezoelectric materials (FGPMs) and overcome the overstiffness of the finite element method (FEM), we present an electromechanical inhomogeneous cell-based smoothed FEM (ISFEM) of FGPMs. Firstly, ISFEM formulations were derived to calculate the transient response of FGPMs, and then, a modified Wilson-θ method was deduced to solve the integration of the FGPM system. The true parameters at the Gaussian integration point in FGPMs were adopted directly to replace the homogenization parameters in an element. ISFEM provides a close-to-exact stiffness of the continuous system, which could automatically and more easily generate for complicated domains and thus significantly decrease numerical errors. The accuracy and trustworthiness of ISFEM were verified as higher than the standard FEM by several numerical examples.

A Coupling Electromechanical Inhomogeneous Cell-Based Smoothed Finite Element Method for Dynamic Analysis of Functionally Graded Piezoelectric Beams