English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Phase measurements obtained by high-coherence interferometry are restricted by the 2 π  ambiguity, to height differences smaller than  λ /2. A further restriction in most interferometric systems is for focusing the system on the measured object. We present two methods that overcome these restrictions. In the first method, different segments of a measured wavefront are digitally propagated and focused locally after measurement. The divergent distances, by which the diverse segments of the wavefront are propagated in order to achieve a focused image, provide enough information so as to resolve the 2 π  ambiguity. The second method employs an interferogram obtained by a spectrum constituting a small number of wavelengths. The magnitude of the interferogram's modulations is utilized to resolve the 2 π  ambiguity. Such methods of wavefront propagation enable several applications such as focusing and resolving the 2 π  ambiguity, as described in the article.

Manipulations of Wavefront Propagation: Useful Methods and Applications for Interferometric Measurements and Scanning