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Phase measurements obtained by high-coherence interferometry are restricted by the 2π ambiguity, to height differences smaller than λ/2. A further restriction in most interferometric systems is for focusing the system on the measured object. We present two methods that overcome these restrictions. In the first method, different segments of a measured wavefront are digitally propagated and focused locally after measurement. The divergent distances, by which the diverse segments of the wavefront are propagated in order to achieve a focused image, provide enough information so as to resolve the 2π ambiguity. The second method employs an interferogram obtained by a spectrum constituting a small number of wavelengths. The magnitude of the interferogram’s modulations is utilized to resolve the 2π ambiguity. Such methods of wavefront propagation enable several applications such as focusing and resolving the 2π ambiguity, as described in the article.

Manipulations of Wavefront Propagation: Useful Methods and Applications for Interferometric Measurements and Scanning