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This work presents the result of structure investigations of V2O5 nanorods grown from thin films and powders prepared by sol-gel method. To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100°C to 600°C.  The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), and mass spectroscopy (MS). The rod-like structure of V2O5 was obtained at 600°C on both quartz glass and silicon substrates and also from the bulk xerogel. The growth process and the effect of annealing treatment on the nanostructure are briefly discussed

The Influence of Thermal Conditions on V2O5Nanostructures Prepared by Sol-Gel Method

The Influence of Thermal Conditions on V₂O₅Nanostructures Prepared by Sol-Gel Method