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Leaf rust, caused by  Puccinia triticina  Eriks., is a common and widespread disease of wheat ( Triticum aestivum  L.) in Egypt. Host resistance is the most economical, effective, and ecologically sustainable method of controlling the disease. Molecular markers help to determine leaf rust resistance genes ( Lr  genes). The objective of this study was to identify  Lr  genes in fifteen wheat cultivars from Egypt. Ten genes,  Lr13 ,  Lr19 ,  Lr24 ,  Lr26 ,  Lr34 ,  Lr35 Lr36 ,  Lr37 ,  Lr39 , and  Lr46 , were detected in fifteen wheat cultivars using various molecular markers. The most frequently occurring genes in fifteen Egyptian wheat cultivars were  Lr13 ,  Lr24 ,  Lr34 , and  Lr36  identified in all the cultivars used, followed by  Lr26  and  Lr35  (93%),  Lr39  (66%),  Lr37  (53%), and  Lr46  (26.6%) of the cultivars, and finally  Lr19  was present in 33.3% of cultivars. It is concluded that there was a good variation in  Lr  genes carried by wheat cultivars commercially grown in Egypt. Therefore, strategies for deploying resistance genes to prolong effective disease resistance are suggested to control wheat leaf rust disease.

Identification of Leaf Rust Resistance Genes in Selected Egyptian Wheat Cultivars by Molecular Markers