Open AccessOptimum Time-Censored Constant-Stress PALTSP for the Burr Type XII Distribution Using Tampered Failure Rate Model
Author(s) -
Pulkit Srivastava,
D. Sharma
Publication year - 2014
Publication title -
journal of quality and reliability engineering
Language(s) - English
Resource type - Journals
eISSN - 2314-8055
pISSN - 2314-8047
DOI - 10.1155/2014/564049
Subject(s) - constant (computer programming) , statistic , mathematics , statistics , variance (accounting) , test plan , product (mathematics) , sample (material) , accelerated life testing , sensitivity (control systems) , sample size determination , type (biology) , stress (linguistics) , mathematical optimization , computer science , weibull distribution , engineering , economics , chromatography , chemistry , biology , accounting , linguistics , ecology , geometry , philosophy , electronic engineering , programming language
This paper presents optimum design of time-censored constant-stress partially accelerated life test sampling plan (PALTSP) in which each item runs either at use or at accelerated conditions and product life follows Burr type XII. The optimal plan consists in finding out sample proportions allocated to both use and accelerated conditions by minimizing the asymptotic variance of test statistic for deciding on acceptance/rejection of the lot such that producer’s and consumer’s interests are safeguarded. The method developed has been illustrated using an example. Sensitivity analysis has also been carried out
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom