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Crystalline silicon PERCs with dot or line openings on rear surface were studied here. By measuring the minor carrier lifetimes of the PERCs with dot and line openings, passivation effects of rear surface with dot and line openings were discussed. The performance affected by dot and line openings was analyzed in detail by testing the open-circuit voltages, short-circuit current densities, fill factors, and conversion efficiencies of the PERCs. The results show that the wider space resulted in better minor carrier lifetimes on the rear surface. And the cells with a line opening space of 0.5 mm had an average of 0.22% improvement of conversion efficiency, compared with the cells with full-area Al-BSF. On the other hand, the dot opening PERCs exhibited only a conversion efficiency of 17.4%, although there had been good rear surface reflectivity. The bad Al-Si alloy layer and large hollow densities in dot Al-contacts resulted in bad performance of the PERCs with dot openings.

Optimization of Rear Local Al-Contacts on High Efficiency Commercial PERC Solar Cells with Dot and Line Openings