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Evaluation of a Metal Supported Ni-YSZ / YSZ / La2NiO4 IT-SOFC Elaborated by Physical Surface Deposition Processes
Author(s) -
J. Fondard,
Pierre Bertrand,
Alain Billard,
Stefan Skrabs,
Thomas Franco,
Sébastien Fourcade,
Pierre Batocchi,
Fabrice Mauvy,
G. Bertrand,
Pascal Briois
Publication year - 2015
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2015-03/1/301
Subject(s) - cathode , materials science , anode , non blocking i/o , layer (electronics) , electrolyte , yttria stabilized zirconia , thin film , sputter deposition , deposition (geology) , chemical engineering , sputtering , composite material , nanotechnology , cubic zirconia , electrode , chemistry , ceramic , paleontology , sediment , engineering , biochemistry , biology , catalysis

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