Open AccessInfluences of Gate Recess Structure on the DCCharacteristics of 0.1-Micron Metamorphic HEMTs
Author(s) -
JungHun Oh,
Yong-Hyun Back,
Seok-Gyu Choi,
SungWoon Moon,
Bok-Hyung Lee,
JinKoo Rhee,
Sam-Dong Kim
Publication year - 2006
Publication title -
ecs meeting abstracts
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2006-01/11/489
Subject(s) - metamorphic rock , materials science , optoelectronics , geology , petrology
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