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Room-temperature transport properties (the zero-field resistivity, \rho 0,and the GMR) were studied for ED Ni50Co50/Cu multilayers as a function of theindividual layer thicknesses and total multilayer thickness. The Cu depositionpotential was optimized in order to obtain the preset layer thicknesses. Thesurface roughness development was studied by AFM, which revealed an exponentialroughening with total thickness. The Cu layer thickness strongly influenced theroughness evolution. As expected, \rho 0 decreased with increasing Cu layerthickness whereas it increased strongly for large total multilayer thicknessesthat could be ascribed to the observed deposit roughening. All multilayers withCu layer thicknesses above about 1.5 nm exhibited a GMR behavior with a maximumGMR of about 5 %. The GMR decreased for total multilayer thicknesses aboveabout 300 nm due to the strong increase of \rho 0, the latter caused by theenhanced roughness. The GMR data indicated the appearance of a current at angleto plane type scattering due to the layer undulations. The thickness evolutionof the MR data was analyzed in detail after separating the ferromagnetic andsuperparamagnetic GMR contributions. It could be established that ED Ni-Co/Cumultilayers do not exhibit an oscillatory GMR behavior with spacer thickness.

Magnetoresistance and surface roughness study of electrodeposited Ni50Co50/Cu multilayers