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Currents injected by CMOS digital circuit blocks into the GndA^ddsystem and into the substrate of a system-on-a-chip may affect reliability and performance of other sensitive circuit blocks. To verify the correct operation of the system, an upper bound for the spectrumof the noise current has to be provided with respect to all possible transitions of the circuit inputs. The number of input transitions is exponential in the number of circuit inputs. In this paper, we present a novel approach for the computationof the upper bound that avoids the untractable ex haustive explorationof the entire space. Its computational complexity is indeed linear in the numberof gates. OurapproachrequiresCMOS standard cell libraries to be characterized for injected noise current. In this paper, we also present an approachfor this characterization of CMOSstandardcells.

A Methodology for the Computation of an Upper Bound on Nose Current Spectrum of CMOS Switching Activity