Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
Author(s) -
Eli BenSasson,
Madhu Sudan,
Salil Vadhan,
Avi Wigderson
Publication year - 2003
Publication title -
digital access to scholarship at harvard (dash) (harvard university)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1145/780627.780631
Subject(s) - randomness , mathematical proof , degree (music) , linearity , mathematics , discrete mathematics , hadamard transform , code (set theory) , expander graph , constant (computer programming) , algorithm , computer science , theoretical computer science , combinatorics , statistics , set (abstract data type) , graph , physics , acoustics , mathematical analysis , geometry , quantum mechanics , programming language
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