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Ellipsometry techniques allow to measure polarization information ofmaterials, requiring precise rotations of optical components with differentconfigurations of lights and sensors. This results in cumbersome capturedevices, carefully calibrated in lab conditions, and in very long acquisitiontimes, usually in the order of a few days per object. Recent techniques allowto capture polarimetric spatially-varying reflectance information, but limitedto a single view, or to cover all view directions, but limited to sphericalobjects made of a single homogeneous material. We present sparse ellipsometry,a portable polarimetric acquisition method that captures both polarimetricSVBRDF and 3D shape simultaneously. Our handheld device consists ofoff-the-shelf, fixed optical components. Instead of days, the total acquisitiontime varies between twenty and thirty minutes per object. We develop a completepolarimetric SVBRDF model that includes diffuse and specular components, aswell as single scattering, and devise a novel polarimetric inverse renderingalgorithm with data augmentation of specular reflection samples via generativemodeling. Our results show a strong agreement with a recent ground-truthdataset of captured polarimetric BRDFs of real-world objects.

Sparse Ellipsometry: Portable Acquisition of Polarimetric SVBRDF and Shape with Unstructured Flash Photography