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Reducing the area overhead required by BIST structures can be achieved by reconfiguring existing hardware to perform test related control and processing functions. This work shows how the resources required for these operations can be implemented in-circuit, taking advantage of programmablelogic available in the system. Structural and functional tests are performed using correlation to obtain and cross-correlation signatures, and to measure gain, phase, and total harmonic distortion. 1. Discussion In today’ s complex circuit assemblies (boards, MCMs, SOCs) different test methods are required to accommodate special needs of different functional blocks. Providing BIST support with low area overhead, over the entire product life-cycle, is of increasing importance. This is particularly true for mixed-signal circuits where both functional and structural tests may have to be combined to get a proper balance between test time, fault coverage, and performance characterization. This work addresses these issues taking advantage of the increasingly common situation where blocks of reconfigurable logic (FPGA) are available to implement system logic. The circuit under test (CUT) consists of a data acquisition board containing a digital core and A/D and D/A interfaces together with the respective filters, which uses reconfigurable hardware to achieve a wide application range. Structural test of the analogue sections relies on evaluating the signatures obtained by cross-correlating power supply ( ) and output voltage ( ) dynamic responses [1]. These correlations are performed in the FPGA using one bit quantisation of the signals — the so called polarity correlation. Functional testing is based on measuring the CUT’s transfer function gain and phase using the correlation technique described in [2], that allows also total harmonic distortion (THD) measurements. Figure 1 shows golden (dotted line) and faulty correlation signatures obtained for the DAC — the faults are f3 a glitch in , f4 a 10% gain reduction, and f7 a 50% degradation of the signal to noise plus distortion ratio. Figure 2 shows golden (dotted line) and faulty correlation signatures obatained for a SC filter — the faults are f5 a 0 This work has been funded by the portuguese government under

Mixed-signal BIST using correlation and reconfigurable hardware (poster paper)