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The objective of this paper is to discuss the possibility of reusing the existing hardware originally present in an analog application to implement test functions for a completely autonomous self-testable solution. In this first approach, a 8/sup th/ order analog linear filter is used as an application example. The required modifications in the circuit are presented with the results in terms of area overhead and fault coverage.

Reuse of existing resources for analog BIST of a switch capacitor filter.