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Recognizing that specification testing of analog circuits involves a high cost and lacks any quantitative measure of the testing process, we adopt a fault-based technique, With the help of hierarchical fault models for parametric and catastrophic faults, and a very eficient fault simulator, our simulation-assisted technique automatically determines the test frequencies to detect ac faults in linear analog circuits. By a suitable choice of parameters m the test generator, we can either determine the best test (maximize the error between the good and the faulty responses) for every fault (resulting in a large test set), or generate the smallest test set for all the faults. Finally, fault coverage values provide a quantitative evaluation of the jinal test set.

Fault-based automatic test generator for linear analog circuits