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Early estimation of defect density using an in-process Haskell metrics model
Author(s) -
Mark Sherriff,
Nachiappan Nagappan,
Laurie Williams,
Mladen A. Vouk
Publication year - 2005
Publication title -
acm sigsoft software engineering notes
Language(s) - English
Resource type - Journals
eISSN - 1943-5843
pISSN - 0163-5948
DOI - 10.1145/1082983.1083285
Subject(s) - haskell , computer science , process (computing) , software bug , suite , software development process , goal driven software development process , software development , reliability engineering , software engineering , software , development testing , programming language , engineering , functional programming , archaeology , history

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