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We investigate shot noise at {\it finite temperatures} induced by thequasi-particle tunneling between fractional quantum Hall (FQH) edge states. Theresulting Fano factor has the peak structure at a certain bias voltage. Such astructure indicates that quasi-particles are weakly {\it glued} due to thermalfluctuation. We show that the effect makes it possible to probe the differenceof statistics between $\nu=1/5,{}2/5$ FQH states where quasi-particles have thesame unit charge.Finally we propose a way to indirectly obtain statisticalangle in hierarchical FQH states.

Analysis of Shot Noise at Finite Temperatures in Fractional Quantum Hall Edge States