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In-situ epitaxial growth of FeSe$_{0.5}$Te$_{0.5}$ thin films is demonstratedon a non-oxide substrate CaF$_2$. Structural analysis reveals that compressivestress is moderately added to 36-nm thick FeSe$_{0.5}$Te$_{0.5}$, which pushesup the critical temperature above 15 K, showing higher values than that of bulkcrystals. Critical current density at $T$ = 4.5 K reaches 5.9 x 10$^4$Acm$^{-2}$ at $\mu_0H$ = 10 T, and 4.2 x 10$^4$ Acm$^{-2}$ at $\mu_0H$ = 14 T.These results indicate that fluoride substrates have high potential for thegrowth of iron-based superconductors in comparison with popular oxidesubstrates.

Epitaxial growth of FeSe$_{0.5}$Te$_{0.5}$ thin films on CaF$_2$ substrates with high critical current density