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The beta-decay half-life of 26Si was measured with a relative precision of1.4*10e3. The measurement yields a value of 2.2283(27) s which is in goodagreement with previous measurements but has a precision that is better by afactor of 4. In the same experiment, we have also measured the non-analoguebranching ratios and could determine the super-allowed one with a precisionsimilar to the previously reported measurements. The experiment was done at theAccelerator Laboratory of the University of Jyvaskyla where we used the IGISOLtechnique with the JYFLTRAP facility to separate pure samples of 26Si.Comment: 8 pages, 7 figures; accepted by EPJ

Precise half-life measurement of the 26Si ground state