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A pronounced step-like (kink) behavior in the temperature dependence ofresistivity $\rho (T)$ is observed in the optimally-doped$Sm_{1.85}Ce_{0.15}CuO_4$ thin films around $T_{sf}=87K$ and attributed tomanifestation of strong spin fluctuations induced by $Sm^{3+}$ moments with theenergy $\hbar \omega_{sf}=k_BT_{sf}\simeq 7meV$. In addition to fluctuationinduced contribution $\rho_{sf}(T)$ due to thermal broadening effects (of thewidth $\omega_{sf}$), the experimental data are found to be well fittedaccounting for residual (zero-temperature) $\rho_{res}$, electron-phonon $\rho_{e-ph}(T)=AT$ and electron-electron $\rho_{e-e}(T)=BT^2$ contributions. Thebest fits produced $\omega_p=2.1meV$, $\tau_0^{-1}=9.5\times 10^{-14}s^{-1}$,$\lambda =1.2$, and $E_F=0.2eV$ for estimates of the plasmon frequency, theimpurity scattering rate, electron-phonon coupling constant, and the Fermienergy, respectively.

Possible manifestation of spin fluctuations in the temperature behavior of resistivity in Sm_{1.85}Ce_{0.15}CuO_4 thin films