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Ravishankar et al. claimed the drive-level capacitance profiling (DLCP)method cannot resolve trap density along depth direction in perovskites withgiven thickness, and explained the measured charges to be a consequence ofgeometrical capacitance and diffusion capacitance. We point out that the trapdensities in DLCP method are derived from the differential capacitance atdifferent frequencies, and thus the background charges caused by diffusion andgeometry capacitance has been subtracted. Even for the non-differential dopinganalysis by DLCP, the contribution from diffusion capacitance is shown to benegligible and contribution from geometry capacitance is excluded. Additionalexperiment results further support the measured trap density represents theactual trap distribution in perovskite solar cells.

Response to comment on "Resolving spatial and energetic distributions of trap states in metal halide perovskite solar cells"