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The imaging and spectral performance of CdTe double-sided strip detectors(CdTe-DSDs) was evaluated for the ASTRO-H mission. The charcterized CdTe-DSDshave a strip pitch of 0.25 mm, an imaging area of 3.2 cm$\times$3.2 cm and athickness of 0.75 mm. The detector was successfully operated at a temperatureof $-20^\circ$C and with an applied bias voltage of 250 V. By using two-stripevents as well as one-strip events for the event reconstruction, a good energyresolution of 2.0 keV at 59.5 keV and a sub-strip spatial resolution wasachieved. The hard X-ray and gamma-ray response of CdTe-DSDs is complex due tothe properties of CdTe and the small pixel effect. Therefore, one of the issuesto investigate is the response of the CdTe-DSD. In order to investigate thespatial dependence of the detector response, we performed fine beam scanexperiments at SPring-8, a synchrotron radiation facility. From theseexperiments, the depth structure of the electric field was determined as wellas properties of carriers in the detector and successfully reproduced theexperimental data with simulated spectra.

Imaging and spectral performance of CdTe double-sided strip detectors for the Hard X-ray Imager onboard ASTRO-H