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Typically, amorphous organic materials contain high density of traps. Trapshinder charge transport and, hence, affect various working parameters oforganic electronic devices. In this paper we suggest a simple but reliablemethod for the estimation of the concentration of deep traps (traps that keepcarriers for a time much longer than the typical transport time of the device).The method is based on the measurement of the dependence of the total charge,collected at the electrode, on the total initial charge, uniformly generated inthe transport layer under the action of a light pulse. Advantages andlimitations of the method are discussed and an experimental example of theestimation of the density of deep traps in photoconductive organic materialpoly(2-methoxy-5-(2'-ethylhexyloxy)-1,4-phenylenevinylene (MEH-PPV) isprovided.

Estimation of the concentration of deep traps in organic photoconductors using two-photon absorption